Hot-carrier reliability of MOS VLSI circuits /

Hot-carrier reliability of MOS VLSI circuits /

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Bibliographic Details
Main Author: Leblebici, Yusuf
Other Authors: Kang, Sung-Mo, 1945-
Format: Book
Language:English
Published: Boston : Kluwer Academic, c1993.
Series:Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing
Kluwer international series in engineering and computer science ; SECS 227.
Subjects:
Integrated circuits > Very large scale integration > Defects > Mathematical models.
Metal oxide semiconductors > Reliability > Mathematical models.
Hot carriers > Reliability > Mathematical models.
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