Proceedings /
Wedi'i Gadw mewn:
| Awduron Corfforaethol: | , , |
|---|---|
| Fformat: | Trafodyn Cynhadledd |
| Iaith: | English |
| Cyhoeddwyd: |
Metals Park, Ohio :
ASM International,.
|
| Pynciau: |
| Cyhoeddwyd: | Began with: 1980. |
|---|---|
| Disgrifiad o'r Eitem: | Description based on: 1986. Issue for 1987 published in 2 vols. called also: Proceedings of the Microelectronics Symposium, and: Proceedings of the Advanced Materials Symposium. Vols. for 1987-<1992> have cover title: Proceedings of the ... International Symposium for Testing and Failure Analysis. Vols. for <1996- > have cover title: Conference proceedings. |
| Disgrifiad Corfforoll: | v. : ill. ; 28 cm. Issued also 1999- on CD-ROM as: Conference proceedings from the ... International Symposium for Testing and Failure Analysis. |
| Publication Frequency: | Annual |
| ISSN: | 0890-1740 |