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Proceedings /

Proceedings /

Sparad:
Bibliografiska uppgifter
Institutionella upphovsmän: International Symposium for Testing and Failure Analysis, Microelectronics Symposium, Advanced Materials Symposium
Materialtyp: Konferenspublikation
Språk:English
Publicerad: Metals Park, Ohio : ASM International,.
Ämnen:
Electronics > Materials > Testing > Congresses.
Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Semiconductors > Testing > Congresses.
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Liknande verk

  • Nondestructive evaluation of semiconductor materials and devices : [lectures presented at the NATO Advanced Study Institute on Nondestructive Evaluation of Semiconductor Materials and Devices, held at the Villa Tuscolano, Italy, September 19-29, 1978] /
    Publicerad: (1979)
  • Introduction to component testing : application electronics /
    av: Stevens, Anthony K., 1948-
    Publicerad: (1986)
  • IEEE international reliability physics proceedings /
    Publicerad: (1994)
  • Factors that affect the precision of mechanical tests /
    Publicerad: (1989)
  • TESTING METHODS AND TECHNIQUES: TESTING ELECTRICAL AND ELECTRONIC DEVICES: A COMPILATION.
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