Proceedings /
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| Korporace: | , , |
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| Médium: | Konferenční příspěvek |
| Jazyk: | English |
| Vydáno: |
Metals Park, Ohio :
ASM International,.
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| Témata: |
| Vydáno: | Began with: 1980. |
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| Popis jednotky: | Description based on: 1986. Issue for 1987 published in 2 vols. called also: Proceedings of the Microelectronics Symposium, and: Proceedings of the Advanced Materials Symposium. Vols. for 1987-<1992> have cover title: Proceedings of the ... International Symposium for Testing and Failure Analysis. Vols. for <1996- > have cover title: Conference proceedings. |
| Fyzický popis: | v. : ill. ; 28 cm. Issued also 1999- on CD-ROM as: Conference proceedings from the ... International Symposium for Testing and Failure Analysis. |
| Četnost vydávání: | Annual |
| ISSN: | 0890-1740 |