VLSI testing : digital and mixed analogue/digital techniques /
Wedi'i Gadw mewn:
Prif Awdur: | |
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Awdur Corfforaethol: | |
Fformat: | Llyfr |
Iaith: | English |
Cyhoeddwyd: |
London :
Institution of Electrical Engineers,
c1998.
|
Cyfres: | IEE circuits, devices and systems series ;
v. 9 |
Pynciau: |
CARM 1 Store
Rhif Galw: |
A2:AQ22G0 C08462 |
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Copi 1 | Ar gael Gwneud Cais |