Neural models and algorithms for digital testing /
Guardado en:
| Autor principal: | |
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| Otros Autores: | , |
| Formato: | Libro |
| Lenguaje: | English |
| Publicado: |
Boston :
Kluwer Academic Publishers,
c1991.
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| Colección: | Kluwer international series in engineering and computer science ;
SECS 140. Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing |
| Materias: |
CARM 1 Store
| Número de Clasificación: |
A2:AJ21D0 C04631 |
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| Copia 1 | Disponible Hacer reserva |