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Neural models and algorithms for digital testing /

Neural models and algorithms for digital testing /

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書目詳細資料
主要作者: Chakradhar, Srimat T.
其他作者: Agrawal, Vishwani D., 1943-, Bushnell, Michael L. (Michael Lee), 1950-
格式: 圖書
語言:English
出版: Boston : Kluwer Academic Publishers, c1991.
叢編:Kluwer international series in engineering and computer science ; SECS 140.
Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing
主題:
Logic circuits > Testing.
Automatic checkout equipment.
Digital integrated circuits > Testing > Data processing.
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索引號: A2:AJ21D0 C04631
復印件 1 可用  預訂

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