Neural models and algorithms for digital testing /
Saved in:
| Main Author: | |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Boston :
Kluwer Academic Publishers,
c1991.
|
| Series: | Kluwer international series in engineering and computer science ;
SECS 140. Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing |
| Subjects: |
CARM 1 Store
| Call Number: |
A2:AJ21D0 C04631 |
|---|---|
| Copy 1 | Available Place a Hold |