Scanning probe microscopies : 20-22 January 1992, Los Angeles, California /
Wedi'i Gadw mewn:
| Awdur Corfforaethol: | |
|---|---|
| Awduron Eraill: | |
| Fformat: | Llyfr |
| Iaith: | English |
| Cyhoeddwyd: |
Bellingham, Wash. :
SPIE--the Society of Photo-optical Instrumentation Engineers,
c1992.
|
| Cyfres: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 1639. |
| Pynciau: |
CARM 1 Store
| Copi 1 | Ar gael Gwneud Cais |
|---|