Scanning probe microscopies : 20-22 January 1992, Los Angeles, California /
Saved in:
| Corporate Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash. :
SPIE--the Society of Photo-optical Instrumentation Engineers,
c1992.
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 1639. |
| Subjects: |
CARM 1 Store
| Copy 1 | Available Place a Hold |
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