Scanning probe microscopies : 20-22 January 1992, Los Angeles, California /
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| Corporate Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash. :
SPIE--the Society of Photo-optical Instrumentation Engineers,
c1992.
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 1639. |
| Subjects: |
| Item Description: | "Conference 1639, Scanning probe microscopies, was part of a four-conference program on laser spectroscopy held in SPIE's OE/LASE '92 Lasers, Sensors & Spectroscopy Symposium, 19-25 January 1992, in Los Angeles"--P. vii. |
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| Physical Description: | ix, 218 p. : ill. ; 28 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0819407852 |