Hot-carrier reliability of MOS VLSI circuits /
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| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Boston :
Kluwer Academic,
c1993.
|
| Series: | Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing
Kluwer international series in engineering and computer science ; SECS 227. |
| Subjects: | |
| Online Access: | Publisher description Table of contents only |
| LEADER | 02319cam a2200397 a 4500 | ||
|---|---|---|---|
| 001 | c000397355 | ||
| 003 | CARM | ||
| 005 | 20140603153733.0 | ||
| 008 | 140603s1993 maua b 001 0 eng d | ||
| 010 | |a 93015447 | ||
| 019 | 1 | |a 68997453 |5 LACONCORD2021 | |
| 020 | |a 079239352X (hbk.) | ||
| 035 | |a (OCoLC)27937993 |5 LACONCORD2021 | ||
| 040 | |a LC |b eng |c LC |d LC | ||
| 050 | 0 | 0 | |a TK7874 |b .L334 1993 |
| 082 | 0 | 4 | |a 621.395 |2 20 |
| 100 | 1 | |a Leblebici, Yusuf. | |
| 245 | 1 | 0 | |a Hot-carrier reliability of MOS VLSI circuits / |c by Yusuf Leblebici, Sung-Mo (Steve) Kang. |
| 260 | |a Boston : |b Kluwer Academic, |c c1993. | ||
| 300 | |a xvi, 212 p. : |b ill. ; |c 25 cm. | ||
| 490 | 1 | |a The Kluwer international series in engineering and computer science, VLSI, computer architecture, and digital signal processing ; |v SECS 227 | |
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | 0 | |a Machine derived contents note: Preface. 1. Introduction. 2. Oxide Degradation Mechanisms in MOS Transistors. 3. Modeling of Degradation Mechanisms. 4. Modeling of Damaged MOSFETs. 5. Transistor-Level Simulation for Circuit Reliability. 6. Fast Timing Simulation for Circuit Reliability. 7. Macromodeling of Hot-Carrier Induced Degradation in MOS Circuits. 8. Circuit Design for Reliability. Index. |
| 650 | 0 | |a Integrated circuits |x Very large scale integration |x Defects |x Mathematical models. | |
| 650 | 0 | |a Metal oxide semiconductors |x Reliability |x Mathematical models. | |
| 650 | 0 | |a Hot carriers |x Reliability |x Mathematical models. | |
| 700 | 1 | |a Kang, Sung-Mo, |d 1945- | |
| 852 | 8 | |b CARM |p 0603446 |f BK | |
| 852 | 8 | |b SCAN |h A3:AH14F0 |i C13015 |p 0603446 |f BK | |
| 830 | 0 | |a Kluwer international series in engineering and computer science. |p VLSI, computer architecture, and digital signal processing | |
| 830 | 0 | |a Kluwer international series in engineering and computer science ; |v SECS 227. | |
| 856 | 4 | 2 | |3 Publisher description |u http://www.loc.gov/catdir/enhancements/fy0821/93015447-d.html |
| 856 | 4 | 1 | |3 Table of contents only |u http://www.loc.gov/catdir/enhancements/fy0821/93015447-t.html |
| 999 | f | f | |i 49b05560-eb61-5fcd-9ad6-2555d5c21455 |s 6ef4a747-cf16-50c7-951c-638f701b6102 |
| 952 | f | f | |p Can circulate |a CAVAL |b CAVAL |c CAVAL |d CARM 1 Store |i book |m 0603446 |
| 952 | f | f | |a CAVAL |b CAVAL |c CAVAL |d Unmapped Location |e C13015 |f A3:AH14F0 |h Other scheme |