Electron microscopy, 1980 : proceedings of the Seventh European Congress on Electron Microscopy, The Hague, The Netherlands, August 24-29, 1980.

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Bibliographic Details
Corporate Authors: European Congress on Electron Microscopy Hague, Netherlands, International Conference on X-ray Optics and Microanalysis
Other Authors: Brederoo, P.
Format: Conference Proceeding Book
Language:English
Published: Leiden : Seventh European Congress on Electron Microscopy Foundation, 1980.
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Description
Item Description:Editors, P. Brederoo ... et al.
Incorporated the Ninth International Conference on X-ray Optics and Microanalysis.
Physical Description:4 v. : ill ; 27 cm.
Bibliography:Includes bibliographical references and index.
ISBN:9090001468
9090001476
9090001484
9090001492