Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2 /

Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2 /

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Dettagli Bibliografici
Autore principale: Marshall, J. C. (Janet C.)
Ente Autore: National Institute of Standards and Technology (U.S.)
Altri autori: Mattis, Richard L.
Natura: Libro
Lingua:English
Pubblicazione: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1992.
Serie:Semiconductor measurement technology
NIST special publication ; 400-90
Soggetti:
SPICE (Computer file)
Metal oxide semiconductors, Complementary > Computer simulation.

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