Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /
Saved in:
| 主要作者: | |
|---|---|
| 企业作者: | |
| 格式: | 图书 |
| 语言: | English |
| 出版: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1992.
|
| 丛编: | Semiconductor measurement technology
NIST special publication ; 400-89 |
| 主题: |
CARM 1 Store
| 索引号: |
A3:AE31C0 F06472 |
|---|---|
| 复印件 1 | 可用 预订 |