Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /
Gorde:
| Egile nagusia: | |
|---|---|
| Erakunde egilea: | |
| Formatua: | Liburua |
| Hizkuntza: | English |
| Argitaratua: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1992.
|
| Saila: | Semiconductor measurement technology
NIST special publication ; 400-89 |
| Gaiak: |
CARM 1 Store
| Sailkapena: |
A3:AE31C0 F06472 |
|---|---|
| Alea 1 | Eskuragarri Erreserbatu |