Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /
保存先:
| 第一著者: | |
|---|---|
| 団体著者: | |
| フォーマット: | 図書 |
| 言語: | English |
| 出版事項: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1992.
|
| シリーズ: | Semiconductor measurement technology
NIST special publication ; 400-89 |
| 主題: |
| 記述事項: | "June 1992." |
|---|---|
| 物理的記述: | iii, 29 p. ; 28 cm. |
| 書誌: | Includes bibliographical references (p. 18) |