Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /

Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /

Gardado en:
Detalles Bibliográficos
Autor Principal: Albers, John
Autor Corporativo: National Institute of Standards and Technology (U.S.)
Formato: Libro
Idioma:English
Publicado: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1992.
Series:Semiconductor measurement technology
NIST special publication ; 400-89
Subjects:
Semiconductors > Thermal properties.
Thermal analysis > Computer programs.
Fourier analysis > Data processing.
Descripción
descrición da copia:"June 1992."
Descrición Física:iii, 29 p. ; 28 cm.
Bibliografía:Includes bibliographical references (p. 18)

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