Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /

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Xehetasun bibliografikoak
Egile nagusia:	Albers, John
Erakunde egilea:	National Institute of Standards and Technology (U.S.)
Formatua:	Liburua
Hizkuntza:	English
Argitaratua:	Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1992.
Saila:	Semiconductor measurement technology NIST special publication ; 400-89
Gaiak:	Semiconductors > Thermal properties. Thermal analysis > Computer programs. Fourier analysis > Data processing.

Deskribapena
Alearen deskribapena:	"June 1992."
Deskribapen fisikoa:	iii, 29 p. ; 28 cm.
Bibliografia:	Includes bibliographical references (p. 18)

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