Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /

Wedi'i Gadw mewn:

Manylion Llyfryddiaeth
Prif Awdur:	Albers, John
Awdur Corfforaethol:	National Institute of Standards and Technology (U.S.)
Fformat:	Llyfr
Iaith:	English
Cyhoeddwyd:	Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1992.
Cyfres:	Semiconductor measurement technology NIST special publication ; 400-89
Pynciau:	Semiconductors > Thermal properties. Thermal analysis > Computer programs. Fourier analysis > Data processing.

Disgrifiad
Disgrifiad o'r Eitem:	"June 1992."
Disgrifiad Corfforoll:	iii, 29 p. ; 28 cm.
Llyfryddiaeth:	Includes bibliographical references (p. 18)

Eitemau Tebyg