Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption /

Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption /

Gespeichert in:
Bibliographische Detailangaben
Körperschaft: National Institute of Standards and Technology (U.S.)
Weitere Verfasser: Baghdadi, A., Scace, Robert I., Walters, E. Jane
Format: Buch
Sprache:English
Veröffentlicht: Gaithersburg, Md. : Washington, DC : U.S. Dept. of Commerce, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1989.
Schriftenreihe:Semiconductor measurement technology
NIST special publication ; 400-82
Schlagworte:
Silicon > Measurement > Databases.
Silicon > Measurement > Statistical methods.
Oxygen > Measurement > Databases.
Oxygen > Measurement > Statistical methods.
Infrared spectroscopy > Databases.
Infrared spectroscopy > Statistical methods.

CARM 1 Store

Bestandesangaben von CARM 1 Store
Signatur: A3:AE31C0 F06472
Exemplar 1 Verfügbar  Bestellen

Ähnliche Einträge