Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption /

Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption /

محفوظ في:
التفاصيل البيبلوغرافية
مؤلف مشترك: National Institute of Standards and Technology (U.S.)
مؤلفون آخرون: Baghdadi, A., Scace, Robert I., Walters, E. Jane
التنسيق: كتاب
اللغة:English
منشور في: Gaithersburg, Md. : Washington, DC : U.S. Dept. of Commerce, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1989.
سلاسل:Semiconductor measurement technology
NIST special publication ; 400-82
الموضوعات:
Silicon > Measurement > Databases.
Silicon > Measurement > Statistical methods.
Oxygen > Measurement > Databases.
Oxygen > Measurement > Statistical methods.
Infrared spectroscopy > Databases.
Infrared spectroscopy > Statistical methods.

CARM 1 Store

تفاصيل المقتنيات من CARM 1 Store
رقم الطلب: A3:AE31C0 F06472
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