Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption /

Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption /

שמור ב:
מידע ביבליוגרפי
מחבר תאגידי: National Institute of Standards and Technology (U.S.)
מחברים אחרים: Baghdadi, A., Scace, Robert I., Walters, E. Jane
פורמט: ספר
שפה:English
יצא לאור: Gaithersburg, Md. : Washington, DC : U.S. Dept. of Commerce, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1989.
סדרה:Semiconductor measurement technology
NIST special publication ; 400-82
נושאים:
Silicon > Measurement > Databases.
Silicon > Measurement > Statistical methods.
Oxygen > Measurement > Databases.
Oxygen > Measurement > Statistical methods.
Infrared spectroscopy > Databases.
Infrared spectroscopy > Statistical methods.
תיאור
תאור פריט:"July 1989."
תיאור פיזי:x, 168 p. : ill. ; 28 cm.
ביבליוגרפיה:Includes bibliographical references.

פריטים דומים