Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) /

Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) /

Guardat en:
Dades bibliogràfiques
Autor principal: Schuster, C. E.
Autor corporatiu: United States. Defense Advanced Research Projects Agency, U.S. Air Force Wright Laboratory
Format: Llibre
Idioma:English
Publicat: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1995.
Col·lecció:Semiconductor measurement technology
NIST special publication.
Matèries:
Microwave integrated circuits > Design > Data processing.
Gallium arsenide semiconductors > Design > Data processing.
Computer-aided design.

CARM 1 Store

Detall dels fons de CARM 1 Store
Signatura: A3:AE31E0 F06481
Còpia 1 Disponible  Fer una reserva

Ítems similars