Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) /

Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) /

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Detalles Bibliográficos
Autor Principal: Schuster, C. E.
Corporate Authors: United States. Defense Advanced Research Projects Agency, U.S. Air Force Wright Laboratory
Formato: Libro
Idioma:English
Publicado: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1995.
Series:Semiconductor measurement technology
NIST special publication.
Subjects:
Microwave integrated circuits > Design > Data processing.
Gallium arsenide semiconductors > Design > Data processing.
Computer-aided design.
Descripción
descrición da copia:"September 1995."
Descrición Física:iv, 88 p. : ill. ; 28 cm.
Bibliografía:Includes bibliographical references (p. 14)

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