Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) /
Gorde:
| Egile nagusia: | |
|---|---|
| Egile korporatiboa: | , |
| Formatua: | Liburua |
| Hizkuntza: | English |
| Argitaratua: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1995.
|
| Saila: | Semiconductor measurement technology
NIST special publication. |
| Gaiak: |
| Alearen deskribapena: | "September 1995." |
|---|---|
| Deskribapen fisikoa: | iv, 88 p. : ill. ; 28 cm. |
| Bibliografia: | Includes bibliographical references (p. 14) |