Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) /

Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) /

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Schuster, C. E.
Körperschaften: United States. Defense Advanced Research Projects Agency, U.S. Air Force Wright Laboratory
Format: Buch
Sprache:English
Veröffentlicht: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1995.
Schriftenreihe:Semiconductor measurement technology
NIST special publication.
Schlagworte:
Microwave integrated circuits > Design > Data processing.
Gallium arsenide semiconductors > Design > Data processing.
Computer-aided design.
Beschreibung
Beschreibung:"September 1995."
Beschreibung:iv, 88 p. : ill. ; 28 cm.
Bibliographie:Includes bibliographical references (p. 14)

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