The measurement of minority carrier diffusion lengths for high purity GaAs using an electron beam induced current technique /
Gespeichert in:
| Weitere Verfasser: | |
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| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Lucas Heights, N.S.W. :
ANSTO,
1990.
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| Schriftenreihe: | ANSTO/E ;
693 |
| Schlagworte: |
| Beschreibung: | "July 1990". |
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| Beschreibung: | 13 p. : ill. ; 30 cm. Also available via World Wide Web. |
| Format: | System requirements: Internet connectivity, World Wide Web browser, Adobe Acrobat reader |
| Bibliographie: | Includes bibliographical references. |