The measurement of minority carrier diffusion lengths for high purity GaAs using an electron beam induced current technique /

Saved in:

Bibliographic Details
Other Authors:	Butcher, K. S. A.
Format:	Book
Language:	English
Published:	Lucas Heights, N.S.W. : ANSTO, 1990.
Series:	ANSTO/E ; 693
Subjects:	Electron beams. Diffusion. Arsenides.

Holdings details from CARM 1 Store
Call Number:	A3:AD08C0 F05855
Copy 1	Available Place a Hold

Similar Items