The measurement of minority carrier diffusion lengths for high purity GaAs using an electron beam induced current technique /

The measurement of minority carrier diffusion lengths for high purity GaAs using an electron beam induced current technique /

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Bibliographic Details
Other Authors: Butcher, K. S. A.
Format: Book
Language:English
Published: Lucas Heights, N.S.W. : ANSTO, 1990.
Series:ANSTO/E ; 693
Subjects:
Electron beams.
Diffusion.
Arsenides.
Description
Item Description:"July 1990".
Physical Description:13 p. : ill. ; 30 cm.
Also available via World Wide Web.
Format:System requirements: Internet connectivity, World Wide Web browser, Adobe Acrobat reader
Bibliography:Includes bibliographical references.

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