Modeling the process dependence of electrical charges associated with the silicon/silicon-dioxide interface /

Modeling the process dependence of electrical charges associated with the silicon/silicon-dioxide interface /

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Hlavní autor: Akinwande, Akintunde Ibitayo
Médium: Diplomová práce Kniha
Jazyk:English
Vydáno: Ann Arbor, MI : University Microfilms International, c1987.
Témata:
Silicon > Electric properties.
Silicon dioxide > Electric properties.
Oxidation.
Integrated circuits > Passivation.
Popis
Fyzický popis:xxii, 157 p. : ill. ; 22 cm.
Bibliografie:Bibliography: p. 135-157.

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