Modeling the process dependence of electrical charges associated with the silicon/silicon-dioxide interface /
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Format: | Thesis Knjiga |
Jezik: | English |
Izdano: |
Ann Arbor, MI :
University Microfilms International,
c1987.
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Teme: |
Fizični opis: | xxii, 157 p. : ill. ; 22 cm. |
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Bibliografija: | Bibliography: p. 135-157. |