Patents at a glance : survey of substantive law and formalities in 45 countries /
Shranjeno v:
Glavni avtor: | |
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Drugi avtorji: | |
Format: | Knjiga |
Jezik: | English German |
Izdano: |
Munich, :
C. Heymanns,
1964.
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Teme: |
CARM 1 Store
Signatura: |
A1:AP25E0 F02033 |
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Kopija 1 | Prosto Rezerviraj |