International Symposium for Testing and Failure Analysis, Microelectronics Symposium, & Advanced Materials Symposium. Proceedings. ASM International,.
芝加哥风格引文International Symposium for Testing and Failure Analysis, Microelectronics Symposium, 与 Advanced Materials Symposium. Proceedings. Metals Park, Ohio: ASM International,.
MLA引文International Symposium for Testing and Failure Analysis, et al. Proceedings. ASM International,.
警告：这些引文格式不一定是100％准确.