International Symposium for Testing and Failure Analysis, Microelectronics Symposium, & Advanced Materials Symposium. Proceedings. ASM International,.
Chicago Style (17th ed.) CitationInternational Symposium for Testing and Failure Analysis, Microelectronics Symposium, and Advanced Materials Symposium. Proceedings. Metals Park, Ohio: ASM International,.
MLA引文International Symposium for Testing and Failure Analysis, et al. Proceedings. ASM International,.
警告：這些引文格式不一定是100％准確.