VLSI testing : digital and mixed analogue/digital techniques /

VLSI testing : digital and mixed analogue/digital techniques /

Kaydedildi:
Detaylı Bibliyografya
Yazar: Hurst, S. L. (Stanley Leonard)
Müşterek Yazar: Institution of Electrical Engineers
Materyal Türü: Kitap
Dil:English
Baskı/Yayın Bilgisi: London : Institution of Electrical Engineers, c1998.
Seri Bilgileri:IEE circuits, devices and systems series ; v. 9
Konular:
Integrated circuits > Very large scale integration > Design and construction.
Computer-aided design.
Integrated services digital networks > Testing.
Diğer Bilgiler
Fiziksel Özellikler:xx, 532 p. : ill. ; 25 cm.
Bibliyografya:Includes bibliographical references and indexes.
ISBN:0852969015

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