VLSI testing : digital and mixed analogue/digital techniques /

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Bibliographic Details
Main Author: Hurst, S. L. (Stanley Leonard)
Corporate Author: Institution of Electrical Engineers
Format: Book
Language:English
Published: London : Institution of Electrical Engineers, c1998.
Series:IEE circuits, devices and systems series ; v. 9
Subjects:
Description
Physical Description:xx, 532 p. : ill. ; 25 cm.
Bibliography:Includes bibliographical references and indexes.
ISBN:0852969015