Hurst, S. L. (1998). VLSI testing: Digital and mixed analogue/digital techniques. Institution of Electrical Engineers.
Citación estilo ChicagoHurst, S. L. VLSI Testing: Digital and Mixed Analogue/digital Techniques. London: Institution of Electrical Engineers, 1998.
Cita MLAHurst, S. L. VLSI Testing: Digital and Mixed Analogue/digital Techniques. Institution of Electrical Engineers, 1998.
Warning: These citations may not always be 100% accurate.