Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems /
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| 主要作者: | |
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| 企業作者: | |
| 格式: | 圖書 |
| 語言: | English |
| 出版: |
Gaithersburg, MD : Washington, D.C. :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O,
[1997].
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| 叢編: | Standard reference materials
NIST special publication ; 260-129 |
| 主題: |
CARM 1 Store
| 索引號: |
A2:AB20H0 F01121 |
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| 復印件 1 | 可用 預訂 |