IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society.
Guardat en:
| Autor corporatiu: | , , |
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| Format: | Revista |
| Idioma: | English |
| Publicat: |
New York, NY :
Institute of Electrical and Electronics Engineers,
c2001-
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| Matèries: | |
| Accés en línia: | http://ieeexplore.ieee.org/lpdocs/epic03/RecentIssues.htm?punumber=7298 http://ieeexplore.ieee.org/servlet/opac?punumber=7298 |
Internet
http://ieeexplore.ieee.org/lpdocs/epic03/RecentIssues.htm?punumber=7298http://ieeexplore.ieee.org/servlet/opac?punumber=7298
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| Signatura: |
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| Còpia 1 | Disponible Fer una reserva |