IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society.
Saved in:
| Corporate Authors: | , , |
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| Format: | Journal |
| Language: | English |
| Published: |
New York, NY :
Institute of Electrical and Electronics Engineers,
c2001-
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| Subjects: | |
| Online Access: | http://ieeexplore.ieee.org/lpdocs/epic03/RecentIssues.htm?punumber=7298 http://ieeexplore.ieee.org/servlet/opac?punumber=7298 |
Internet
http://ieeexplore.ieee.org/lpdocs/epic03/RecentIssues.htm?punumber=7298http://ieeexplore.ieee.org/servlet/opac?punumber=7298
CARM 1 Store
| Call Number: |
A3:AD16C0 D06987 |
|---|---|
| Copy 1 | Available Place a Hold |