Fault-tolerance through reconfiguration of VLSI and WSI arrays /

Fault-tolerance through reconfiguration of VLSI and WSI arrays /

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Bibliographic Details
Main Author: Negrini, R.
Other Authors: Sami, Mariagiovanna, Stefanelli, Renato
Format: Book
Language:English
Published: Cambridge, Mass. : MIT Press, c1989.
Series:MIT Press series in computer systems.
Subjects:
Integrated circuits > Fault tolerance.
Integrated circuits > Very large scale integration.
Integrated circuits > Wafer-scale integration.

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