APA (7th ed.) Citation

International Test Conference Philadelphia, Pa., IEEE Computer Society. Test Technology Committee, & Institute of Electrical and Electronics Engineers (U.S.). Philadelphia Section. (1984). The three faces of test: Design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984. IEEE Computer Society Press.

Chicago Style (17th ed.) Citation

International Test Conference Philadelphia, Pa., IEEE Computer Society. Test Technology Committee, and Institute of Electrical and Electronics Engineers (U.S.). Philadelphia Section. The Three Faces of Test: Design, Characterization, Production : International Test Conference, 1984 Proceedings, October 16, 17, 18, 1984. Silver Spring, MD: IEEE Computer Society Press, 1984.

MLA (8th ed.) Citation

International Test Conference Philadelphia, Pa., et al. The Three Faces of Test: Design, Characterization, Production : International Test Conference, 1984 Proceedings, October 16, 17, 18, 1984. IEEE Computer Society Press, 1984.