Analytical and testing methodologies for design with advanced materials : proceedings of the International Conference on Analytical and Testing Methodologies for Design with Advanced Materials (ATMAN '87), August 26-28, 1987 /

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Bibliographic Details
Corporate Author: International Conference on Analytical and Testing Methodologies for Design with Advanced Materials Montreal, Quebec
Other Authors: Sih, G. C. (George C.), Pindera, Jerzy-Tadeusz, Hoa, S. V. (Suong V.)
Format: Conference Proceeding Book
Language:English
Published: Amsterdam ; New York : New York, N.Y., U.S.A. : North-Holland ; Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1988.
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