Predložene teme unutar tvog pretraživanja.
Prikaz rezultata 1 – 18 od 18 za pretraživanje '', vrijeme pretraživanja: 0,02s Detaljiziraj rezultate
  1. 1
    An introduction to the chemistry of the silicones.
    Knjiga
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  2. 2
    Methods for the analysis of iron ores. Part 3 : Method for the determination of silicon in iron ores (gravimetric method)
    Knjiga
    Izdano 1972
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  3. 3
    An introduction to the chemistry of the silicones,
    Knjiga
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  4. 4
    The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements /
    Knjiga
    od Ehrstein, James R.
    Izdano 1999
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  5. 5
    Silicon semiconductor technology /
    Knjiga
    od Runyan, W. R.
    Izdano 1965
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  6. 6
    Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption /
    Knjiga
    Izdano 1989
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  7. 7
    Lifetime factors in silicon : a symposium /
    Knjiga
    Izdano 1980
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  8. 8
    Silicon semiconductor data /
    Knjiga
    od Wolf, Helmut F.
    Izdano 1969
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  9. 9
    Fundamentals of silicon integrated device technology /
    Knjiga
    Izdano 1967
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  10. 10
    Systems on silicon : an International Specialist Seminar on Systems on Silicon /
    Izvještaj sastanka Knjiga
    Izdano 1984
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  11. 11
    Evolution of silicon materials characterization : lessons learned for improved manufacturing /
    Knjiga
    od Bullis, W. Murray, 1930-
    Izdano 1993
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  12. 12
    Properties of amorphous silicon.
    Knjiga
    Izdano 1989
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  13. 13
    Modeling the process dependence of electrical charges associated with the silicon/silicon-dioxide interface /
    Disertacija Knjiga
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  14. 14
    Silicon chemistry.
    Knjiga
    Izdano 1974
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  15. 15
    Silicic science; a review of the colloid scientific properties and phenomena exhibited by matter composed essentially of the element silicon.
    Knjiga
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  16. 16
    Preparation and certification of SRM-2530, ellipsometric parameters [delta] and [psi] and derived thickness and refractive index of a silicon dioxide layer on silicon /
    Knjiga
    Izdano 1988
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  17. 17
    Silicon in water and effluents 1980 : methods for the examination of waters and associated materials.
    Knjiga
    Izdano 1981
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  18. 18
    Circuits with semiconductor components /
    Knjiga
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