Proceedings of the 13th International Conference on Defects in Semiconductors /

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Detalles Bibliográficos
Autores Corporativos: International Conference on Defects in Semiconductors Coronado, Calif., Metallurgical Society of AIME. Electronic Materials Committee
Otros Autores: Kimerling, L. C., Parsey, J. M. (John Michael), 1953-
Formato: Procedimiento de la Conferencia Libro
Lenguaje:English
Publicado: Warrendale, Pa : The Metallurgical Society of AIME, 1985.
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111 2 |a International Conference on Defects in Semiconductors  |n (13th :  |d 1984 :  |c Coronado, Calif.) 
245 1 0 |a Proceedings of the 13th International Conference on Defects in Semiconductors /  |c Thirteenth International Conference on Defects in Semiconductors; sponsored by the Electronic Materials Committee of the Metallurgical Society of AIME, held at Coronado, California, August 12-17, 1984 ; edited by L.C. Kimerling and J.M. Parsey, Jr. 
260 |a Warrendale, Pa :  |b The Metallurgical Society of AIME,  |c 1985. 
300 |a xxiii, 1252 p. :  |b ill. ;  |c 24 cm. 
504 |a Includes bibliographies and indexes. 
650 0 |a Semiconductors  |x Defects  |v Congresses. 
700 1 |a Kimerling, L. C. 
700 1 |a Parsey, J. M.  |q (John Michael),  |d 1953- 
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