Proceedings of the 13th International Conference on Defects in Semiconductors /

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Bibliographic Details
Corporate Authors: International Conference on Defects in Semiconductors Coronado, Calif., Metallurgical Society of AIME. Electronic Materials Committee
Other Authors: Kimerling, L. C., Parsey, J. M. (John Michael), 1953-
Format: Conference Proceeding Book
Language:English
Published: Warrendale, Pa : The Metallurgical Society of AIME, 1985.
Subjects:
Description
Physical Description:xxiii, 1252 p. : ill. ; 24 cm.
Bibliography:Includes bibliographies and indexes.
ISBN:0895204851