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| LEADER |
01331cam a2200361 a 4500 |
| 001 |
c000397313 |
| 003 |
CARM |
| 005 |
20140603092258.0 |
| 008 |
140603s1987 nyua b 001 0 eng d |
| 010 |
|
|
|a 87003957
|
| 019 |
1 |
|
|a 69841541
|5 LACONCORD2021
|
| 020 |
|
|
|a 087942222X (pbk.)
|
| 035 |
|
|
|a (OCoLC)15519386
|5 LACONCORD2021
|
| 040 |
|
|
|a LC
|b eng
|c LC
|d LC
|
| 050 |
0 |
0 |
|a TK7870
|b .S414 1987
|
| 082 |
0 |
4 |
|a 621.381
|2 23
|
| 245 |
0 |
0 |
|a Selected papers on analog fault diagnosis /
|c edited by Ruey-Wen Liu.
|
| 246 |
3 |
|
|a Analog fault diagnosis
|
| 246 |
3 |
8 |
|a Analog fault diagnosis
|
| 260 |
|
|
|a New York :
|b IEEE Press,
|c c1987.
|
| 300 |
|
|
|a iii, 143 p. :
|b ill. ;
|c 28 cm.
|
| 490 |
1 |
|
|a Advances in circuits and systems
|
| 500 |
|
|
|a "IEEE order number: PP0213-9"--T.p. verso.
|
| 504 |
|
|
|a Includes bibliographies and index.
|
| 650 |
|
0 |
|a Analog electronic systems
|x Testing.
|
| 650 |
|
0 |
|a Electric fault location.
|
| 700 |
1 |
|
|a Liu, Ruey-Wen,
|d 1930-
|
| 852 |
8 |
|
|b CARM
|p 0603404
|f BK
|
| 852 |
8 |
|
|b SCAN
|h A3:AH10D0
|i F08860
|p 0603404
|f BK
|
| 830 |
|
0 |
|a Advances in circuits and systems
|
| 999 |
f |
f |
|i 52c9472e-8c09-57f2-9420-870a99fd5e68
|s 4d1a074a-4592-50dd-a846-946c4f6a4771
|
| 952 |
f |
f |
|p Can circulate
|a CAVAL
|b CAVAL
|c CAVAL
|d CARM 1 Store
|i book
|m 0603404
|
| 952 |
f |
f |
|a CAVAL
|b CAVAL
|c CAVAL
|d Unmapped Location
|e F08860
|f A3:AH10D0
|h Other scheme
|