Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] /

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Údar corparáideach: NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods Durham, England
Rannpháirtithe: Bowen, D. Keith (David Keith), 1940-, Tanner, B. K. (Brian Keith)
Formáid: Imeacht comhdhála LEABHAR
Teanga:English
Foilsithe / Cruthaithe: New York, N.Y. : Plenum Press, c1980.
Sraith:NATO advanced study institutes series. Physics ; v. 63
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