Lau, J. H. (1993). Thermal stress and strain in microelectronics packaging. Van Nostrand Reinhold.
Citación estilo ChicagoLau, John H. Thermal Stress and Strain in Microelectronics Packaging. New York: Van Nostrand Reinhold, 1993.
Cita MLALau, John H. Thermal Stress and Strain in Microelectronics Packaging. Van Nostrand Reinhold, 1993.
Warning: These citations may not always be 100% accurate.