Reliability stress and failure rate data for electronic equipment.
Guardado en:
| Autor Corporativo: | |
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| Formato: | Libro |
| Lenguaje: | English |
| Publicado: |
Washington, D.C. :
Department of Defense,
1965.
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| Colección: | Military handbook (United States. Dept. of Defense)
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| Materias: |
CARM 1 Store
| Copia 1 | Disponible Hacer reserva |
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